A probe card is an edge between an electronic test system and semiconductor wafer. It is used to check quality of IC’s or LSI in the first process of semiconductor manufacturing. Typically, the probe card is mechanically docked to a prober and electrically connected to a tester. The main function of a probe card is to provide an electrical path between the test system and the circuits on the wafer, where the circuits can be tested and validated. The main parts that are included in a probe cards are PCB (printed circuit board) and some forms of contact elements. There are new probe cards needed for each and every new wafer that is manufactured by the semiconductor manufacturer. Even if the size of the instrument shrinks in future then there had to be new probe cards used in those instruments. This is because probe card is effectively a custom connector that takes the universal pattern of a given tester and translates the signals to connect to electrical pads on the wafer. These pa...